Scientific research microscope / atomic force Innova Bruker Nano Surface

Scientific research microscope / atomic force Innova Bruker Nano Surface

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Providing complete AFM capabilities to fit your budget Offering lowest noise and highest AFM resolution in its class Delivering an economical solution with complete AFM capabilities Offering easy setup and fast time to research-quality results The Innova® Atomic Force Microscope (AFM) delivers accurate, high-resolution imaging and a wide range of functionality for advanced research in physical, life, and material sciences. The system has been engineered to provide an unmatched combination of productivity, ease of use, and application flexibility for the most demanding scientific research, all at a moderate cost. It offers a unique, state-of-the-art closed-loop scan linearization system that ensures accurate measurements and noise levels approaching those of open-loop operation. Innova delivers atomic resolution with great ease and scans up to 90 microns without the need to change scanner hardware. The integrated, high-resolution color optics and programmable, motorized Z-stage make finding features and changing tips or samples fast and easy.
  • Microscopy type:atomic force
40 Manning Rd,
United States
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