Atomic force microscope Dimension FastScan® Bruker Nano Surface

Atomic force microscope Dimension FastScan® Bruker Nano Surface
Dimension FastScan®

for Price / Quote
for Documentation
for Questions

World?s Fastest AFM Setting new standards of performance Delivering ultimate performance on any AFM sample Rendering high-quality data faster Providing quantitative nanoscale material property mapping Powered by PeakForce Tapping The Dimension FastScan® delivers, for the first time, extreme imaging speed without loss of resolution, loss of force control, added complexity, or additional operating costs. This tip-scanning system provides measurements on both large and small size samples in air or fluids. With the FastScan you can achieve immediate atomic force microscopy images with the expected high resolution of a high-performance AFM, all in a single system. Whether surveying a sample scanning at >125Hz to find the region of interest, or scanning for detail at 1-second per image frame in air or fluids, the Dimension FastScan will redefine your AFM experience.
  • Microscopy type:atomic force
40 Manning Rd,
Billerica
× × × × × × ×