Quick, precise and efficient diagnosis The Ellipse system allows all ICSstandardised examinations to be carried out easily and comfortably, delivering the entire spectrum of analytical measurements in just one sitting. High sampling rates maximise measurement density, while an artefact detector identifies and compensates for irregularities occurring during the examination. Powerful integrated software generates high-contrast graphic curves, thus facilitating a sound diagnosis. Ellipse can be progressively extended in its use by combining standard components with application-specific assemblies. Updates covering new analysis methods are easily integrated into the system, ensuring its long-term utility. Benefits at a glance: High-quality reproducible analyses Brief and comfortable examinations Cost-effective and easy to operate Individual system configuration