AA3000 Scanning Probe Microscope is our most popular model. This unit is tailored towards research and industry applications, where the user is required to perform rapid and simple analysis. The detector is built directly into the base, eliminating the chance of damaging it through handling. AA3000 is capable of performing contact mode, tapping mode, lateral force microscopy and scanning tunneling microscopy. The standard unit is equipped to view sample areas up to 10 micron by 10 micron. The system can be customized to measure larger areas. With a Digital Signal Processor (DSP) TMS320C642 inside the systems, AA3000 can handle complicated multi-functional tasks efficiently. A real-time operating system of SPM/DNA is embedded in AA3000 SPM system. High Performance Atomic-scale of resolution Large sample size DSP (Digital Signal Processor)- for great performance Real time operating system embedded Fast Ethernet connection with computer Multi-Function Atomic Force Microscope (AFM) Scanning Tunneling Microscope (STM) Lateral Force Microscope (LFM) Force Analysis: I-V Curve, I-Z Curve, Force Curve Online real-time 3D image for better observation Multi-channel signals for more sample details Trace-Retrace scan, Back-Forward scan Multi-Analysis: Granularity and Roughness Data load-out for further analysis Easy Operation Fast automatically tip-engaging Simple change of the tip holder to switch between STM and AFM Full digital control, auto system status recognition Software-based sample movement